Xin Bi
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2008
1
EE
Xin Bi,
Han Ding
: Detection of Local Mura Defects in TFT-LCD Using Machine Vision.
ICIRA (1) 2008
: 707-715
Coauthor
Index
1
Han Ding
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
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