| |
| 2007 | ||
|---|---|---|
| 3 | Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskarani: Built in Defect Prognosis for Embedded Memories. DDECS 2007: 167-172 | |
| 2 | EE | Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskarani: GALS Based Shared Test Architecture for Embedded Memories. ISCAS 2007: 157-160 |
| 1 | EE | Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskarani: Low Area Adaptive Fail-Data Compression Methodology for Defect Classification and Production Phase Prognosis. ISVLSI 2007: 171-178 |
| 1 | Prashant Dubey | [1] [2] [3] |
| 2 | Akhil Garg | [1] [2] [3] |