| |
| 2004 | ||
|---|---|---|
| 2 | EE | David I. Bergman, Bryan C. Waltrip: Low thermal error sampling comparator for accurate settling measurements. ISCAS (1) 2004: 521-524 |
| 2002 | ||
| 1 | EE | David I. Bergman, Hans Engler: Improved IDDQ Testing with Empirical Linear Prediction. ITC 2002: 954-963 |
| 1 | Hans Engler | [1] |
| 2 | Bryan C. Waltrip | [2] |