V. Beiu
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2006
1
EE
V. Beiu,
W. Ibrahim
,
Y. A. Alkhawwar
,
M. H. Sulieman
: Gate Failures Effectively Shape Multiplexing.
DFT 2006
: 29-40
Coauthor
Index
1
Y. A. Alkhawwar
[
1
]
2
W. Ibrahim
[
1
]
3
M. H. Sulieman
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
