Robert C. Baumann

List of publications from the DBLP Bibliography Server - FAQ

2001

1 EE Robert C. Baumann, Eric B. Smith: Neutron-induced ¹⁰B fission as a major source of soft errors in high density SRAMs. Microelectronics Reliability 41(2): 211-218 (2001)

2001
1	EE	Robert C. Baumann, Eric B. Smith: Neutron-induced ¹⁰B fission as a major source of soft errors in high density SRAMs. Microelectronics Reliability 41(2): 211-218 (2001)

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