2005 | ||
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1 | EE | M. A. Mastro, J. R. LaRoche, N. D. Bassim, C. R. Eddy: Simulation on the effect of non-uniform strain from the passivation layer on AlGaN/GaN HEMT. Microelectronics Journal 36(8): 705-711 (2005) |
1 | C. R. Eddy | [1] |
2 | J. R. LaRoche | [1] |
3 | M. A. Mastro | [1] |