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C. R. Eddy

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2005
1EEM. A. Mastro, J. R. LaRoche, N. D. Bassim, C. R. Eddy: Simulation on the effect of non-uniform strain from the passivation layer on AlGaN/GaN HEMT. Microelectronics Journal 36(8): 705-711 (2005)

Coauthor Index

1N. D. Bassim [1]
2J. R. LaRoche [1]
3M. A. Mastro [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)