E. M. Baskin
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2002
1
EE
E. M. Baskin: Analysis of burn-in time using the general law of reliability.
Microelectronics Reliability 42
(12): 1967-1974 (2002)
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Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)