Daniel S. Barclay
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1986
1
EE
Daniel S. Barclay,
James R. Armstrong
: A heuristic chip-level test generation algorithm.
DAC 1986
: 257-262
Coauthor
Index
1
James R. Armstrong
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
