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Mark R. Barber

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1986
2 Mark R. Barber, Walter I. Satre: Timing Measurements on CMOS VLSI Devices Designed to Drive TTL Loads. ITC 1986: 161-168
1983
1 Mark R. Barber: Subnanosecond Timing Measurements on MOS Devices Using Modern VLSI Test Systems. ITC 1983: 170-180

Coauthor Index

1Walter I. Satre [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)