| |
| 2009 | ||
|---|---|---|
| 1 | EE | Abhisek Dixit, Anirban Bandhyopadhyay, Nadine Collaert, Kristin De Meyer, Malgorzata Jurczak: Measurement and Analysis of Parasitic Capacitance in FinFETs with High-k Dielectrics and Metal-Gate Stack. VLSI Design 2009: 253-258 |
| 1 | Nadine Collaert | [1] |
| 2 | Abhisek Dixit | [1] |
| 3 | Malgorzata Jurczak | [1] |
| 4 | Kristin De Meyer | [1] |