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Thomas Arnold

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2006
1EECraig Gaw, Thomas Arnold, Robert Martin, Lisa Zhang, Dragan Zupac: Evaluation of SiGe: C HBT intrinsic reliability using conventional and step stress methodologies. Microelectronics Reliability 46(8): 1272-1278 (2006)

Coauthor Index

1Craig Gaw [1]
2Robert Martin [1]
3Lisa Zhang [1]
4Dragan Zupac [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)