| |
| 2006 | ||
|---|---|---|
| 1 | EE | Craig Gaw, Thomas Arnold, Robert Martin, Lisa Zhang, Dragan Zupac: Evaluation of SiGe: C HBT intrinsic reliability using conventional and step stress methodologies. Microelectronics Reliability 46(8): 1272-1278 (2006) |
| 1 | Craig Gaw | [1] |
| 2 | Robert Martin | [1] |
| 3 | Lisa Zhang | [1] |
| 4 | Dragan Zupac | [1] |