2008 |
3 | EE | Masakazu Aoki,
Shin-ichi Ohkawa,
Hiroo Masuda:
Concise Modeling of Transistor Variations in an LSI Chip and Its Application to SRAM Cell Sensitivity Analysis.
IEICE Transactions 91-C(4): 647-654 (2008) |
2005 |
2 | EE | Hiroo Masuda,
Shin-ichi Ohkawa,
Masakazu Aoki:
Approach for physical design in sub-100 nm era.
ISCAS (6) 2005: 5934-5937 |
1 | EE | Masakazu Aoki,
Shin-ichi Ohkawa,
Hiroo Masuda:
Design Guidelines and Process Quality Improvement for Treatment of Device Variations in an Lsi Chip.
IEICE Transactions 88-C(5): 788-795 (2005) |