1998 | ||
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3 | EE | Bapiraju Vinnakota, Jason Andrews: Fast fault translation. IEEE Trans. VLSI Syst. 6(1): 122-133 (1998) |
1994 | ||
2 | EE | Bapiraju Vinnakota, Jason Andrews: Functional Test Generation for FSMs by Fault Extraction. DAC 1994: 712-715 |
1992 | ||
1 | Bapiraju Vinnakota, Jason Andrews: Repair of RAMs With Clustered Faults. ICCD 1992: 582-585 |
1 | Bapiraju Vinnakota | [1] [2] [3] |