1997 | ||
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2 | EE | Alaaeldin A. Amin, Mohamed Y. Osman, Radwan E. Abdel-Aal, Husni Al-Muhtaseb: New fault models and efficient BIST algorithms for dual-port memories. IEEE Trans. on CAD of Integrated Circuits and Systems 16(9): 987-1000 (1997) |
1994 | ||
1 | Alaaeldin A. Amin, Mohamed Y. Osman, Radwan E. Abdel-Aal, Husni Al-Muhtaseb: Efficient O(sqrt(n)) BIST Algorithms for DDNPS Faults in Dual-Port Memories. ITC 1994: 850-859 |
1 | Radwan E. Abdel-Aal | [1] [2] |
2 | Husni Al-Muhtaseb (Husni A. Al-Muhtaseb) | [1] [2] |
3 | Mohamed Y. Osman | [1] [2] |