Alexander Ambatiello

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2001

1 EE Alexander Ambatiello, Josef Deichler: Low and high temperature device reliability investigations of buried p-channel MOSFETs of a 0.17 mum technology. Microelectronics Reliability 41(12): 1915-1921 (2001)

2001
1	EE	Alexander Ambatiello, Josef Deichler: Low and high temperature device reliability investigations of buried p-channel MOSFETs of a 0.17 mum technology. Microelectronics Reliability 41(12): 1915-1921 (2001)

Coauthor Index

1 Josef Deichler [1]