Mohsen Alavi
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2003
1
EE
Mohsen Alavi: Overview of Reliability Issues in Deep Sub-Micron Digital CMOS Technology and Their Interaction with Circuit Design Considerations.
ISQED 2003
: 12
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)