Maher Al-Sherif
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1999
1
EE
Mostafa H. Abd-El-Barr
, Maher Al-Sherif,
Mohamed Osman
: Fault Characterization and Testability Considerations in Multi-Valued Logic Circuits.
ISMVL 1999
: 262-267
Coauthor
Index
1
Mostafa H. Abd-El-Barr
[
1
]
2
Mohamed Osman
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
