| |
| 1987 | ||
|---|---|---|
| 1 | EE | A. Akiyama, T. Hosoi, I. Ishihara, S. Matsumoto, T. Niimi: Computer Simulation of Impurity Diffusion in Semiconductors by the Monte Carlo Method. IEEE Trans. on CAD of Integrated Circuits and Systems 6(2): 185-189 (1987) |
| 1 | T. Hosoi | [1] |
| 2 | I. Ishihara | [1] |
| 3 | S. Matsumoto | [1] |
| 4 | T. Niimi | [1] |