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| 1996 | ||
|---|---|---|
| 1 | EE | Alok Agrawal, Alexander Saldanha, Luciano Lavagno, Alberto L. Sangiovanni-Vincentelli: Compact and complete test set generation for multiple stuck-faults. ICCAD 1996: 212-219 |
| 1 | Luciano Lavagno | [1] |
| 2 | Alexander Saldanha | [1] |
| 3 | Alberto L. Sangiovanni-Vincentelli | [1] |