1996 | ||
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1 | EE | Alok Agrawal, Alexander Saldanha, Luciano Lavagno, Alberto L. Sangiovanni-Vincentelli: Compact and complete test set generation for multiple stuck-faults. ICCAD 1996: 212-219 |
1 | Luciano Lavagno | [1] |
2 | Alexander Saldanha | [1] |
3 | Alberto L. Sangiovanni-Vincentelli | [1] |