| |
| 2006 | ||
|---|---|---|
| 1 | EE | Weida Hu, Xiaoshuang Chen, Xuchang Zhou, Zhijue Quan, Lu Wei: Quantum-mechanical effects and gate leakage current of nanoscale n-type FinFETs: A 2d simulation study. Microelectronics Journal 37(7): 613-619 (2006) |
| 1 | Xiaoshuang Chen | [1] |
| 2 | Weida Hu | [1] |
| 3 | Zhijue Quan | [1] |
| 4 | Lu Wei | [1] |