Yu-Kang Zhang
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2006
1
Yih-Chih Chiou
, Yu-Kang Zhang: An Edge-Based Registration Method for Locating Defects on PCB Films.
IPCV 2006
: 209-215
Coauthor
Index
1
Yih-Chih Chiou
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
