W. Zbijewski
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2006
1
EE
W. Zbijewski,
Freek J. Beekman
: Efficient Monte Carlo Based Scatter Artifact Reduction in Cone-Beam Micro-CT.
IEEE Trans. Med. Imaging 25
(7): 817-827 (2006)
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1
Freek J. Beekman
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Sun May 17 03:24:02 2009 by
Michael Ley
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ley@uni-trier.de
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