Robert C. Zak Jr.
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1992
1
Robert C. Zak Jr.,
Jeffrey V. Hill
: An IEEE 1149.1 Compliant Testability Architecture with Internal Scan.
ICCD 1992
: 436-442
Coauthor
Index
1
Jeffrey V. Hill
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
