Wang-Yiu Yuen

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1997

1 EE Benjamin J. C. Yuan, Wang-Yiu Yuen: The Analysis of Competitive Factors of Integrated Circuit Industry in Taiwan - A Case Study of DRAM (Dynamic Random Access Memory). HICSS (3) 1997: 505-517

1997
1	EE	Benjamin J. C. Yuan, Wang-Yiu Yuen: The Analysis of Competitive Factors of Integrated Circuit Industry in Taiwan - A Case Study of DRAM (Dynamic Random Access Memory). HICSS (3) 1997: 505-517

Coauthor Index

1 Benjamin J. C. Yuan [1]