Jiang Wen Yuan
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2006
1
EE
Chen Wen Yue
,
Yu Jie
, Jiang Wen Yuan: Achieving reliability in OEM/ODM CPE products.
Bell Labs Technical Journal 11
(1): 209-213 (2006)
Coauthor
Index
1
Yu Jie
[
1
]
2
Chen Wen Yue
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
