Myung-Kyoon Yim
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2000
1
EE
Hoon Choi
, Myung-Kyoon Yim,
Jae Young Lee
,
Byeong-Whee Yun
,
Yun-Tae Lee
: Formal Verification of an Industrial System-on-a-Chip.
ICCD 2000
: 453-458
Coauthor
Index
1
Hoon Choi
[
1
]
2
Jae Young Lee
[
1
]
3
Yun-Tae Lee
[
1
]
4
Byeong-Whee Yun
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)