Ron-Hwa Yang

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2005

1 EE Du-Ming Tsai, Ron-Hwa Yang: An eigenvalue-based similarity measure and its application in defect detection. Image Vision Comput. 23(12): 1094-1101 (2005)

2005
1	EE	Du-Ming Tsai, Ron-Hwa Yang: An eigenvalue-based similarity measure and its application in defect detection. Image Vision Comput. 23(12): 1094-1101 (2005)

Coauthor Index

1 Du-Ming Tsai [1]