| |
| 2009 | ||
|---|---|---|
| 1 | EE | Aditya P. Karmarkar, Xiaopeng Xu, Victor Moroz, Greg Rollins, Xiao Lin: Analysis of performance and reliability trade-off in dummy pattern design for 32-nm technology. ISQED 2009: 185-189 |
| 1 | Aditya P. Karmarkar | [1] |
| 2 | Xiao Lin | [1] |
| 3 | Victor Moroz | [1] |
| 4 | Greg Rollins | [1] |