Y. Xing
List of publications from the
DBLP Bibliography Server
-
FAQ
Ask others: ACM
DL
/
Guide
-
CiteSeer
-
CSB
-
Google
-
MSN
-
Yahoo
1998
1
EE
Y. Xing: Defect-oriented testing of mixed-signal ICs: some industrial experience.
ITC 1998
: 678-687
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)