A. Xia
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1999
1
EE
W. Wen
, A. Xia: Verifying edges for visual inspection purposes.
Pattern Recognition Letters 20
(3): 315-328 (1999)
Coauthor
Index
1
W. Wen
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
