F. Van de Wiele
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1985
1
EE
E. Palm
, F. Van de Wiele: Current Lines and Accurate Contact Current Evaluation in 2-D Numerical Simulation of Semiconductor Devices.
IEEE Trans. on CAD of Integrated Circuits and Systems 4
(4): 496-503 (1985)
Coauthor
Index
1
E. Palm
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)