Christian Weyand

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2007

1 EE Dieter Zöbel, Christian Weyand: Augmenting sensitivity analysis for embedded applications by program level derivation of process parameters. SIES 2007: 17-24

2007
1	EE	Dieter Zöbel, Christian Weyand: Augmenting sensitivity analysis for embedded applications by program level derivation of process parameters. SIES 2007: 17-24

Coauthor Index

1 Dieter Zöbel [1]