C.-Y. Wen

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1998

1 EE C.-Y. Wen, Raj Acharya: Self-similar texture characterization using a Fourier-domain maximum likelihood estimation method. Pattern Recognition Letters 19(8): 735-739 (1998)

1998
1	EE	C.-Y. Wen, Raj Acharya: Self-similar texture characterization using a Fourier-domain maximum likelihood estimation method. Pattern Recognition Letters 19(8): 735-739 (1998)

Coauthor Index

1 Raj Acharya [1]