David C. Tou Wei

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2006

1 EE D. Ghosh, David C. Tou Wei: Material Classification Using Morphological Pattern Spectrum for Extracting Textural Features from Material Micrographs. ACCV (2) 2006: 623-632

2006
1	EE	D. Ghosh, David C. Tou Wei: Material Classification Using Morphological Pattern Spectrum for Extracting Textural Features from Material Micrographs. ACCV (2) 2006: 623-632

Coauthor Index

1 D. Ghosh [1]