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J. W. Wan

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2007
2EEJ. W. Wan, W. J. Zhang, D. J. Bergstrom: Recent advances in modeling the underfill process in flip-chip packaging. Microelectronics Journal 38(1): 67-75 (2007)
2005
1EEJ. W. Wan, W. J. Zhang, D. J. Bergstrom: Influence of transient flow and solder bump resistance on underfill process. Microelectronics Journal 36(8): 687-693 (2005)

Coauthor Index

1D. J. Bergstrom [1] [2]
2W. J. Zhang [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)