C.-P. Wan
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1989
1
EE
C.-P. Wan,
B. J. Sheu
: Temperature dependence modeling for MOS VLSI circuit simulation.
IEEE Trans. on CAD of Integrated Circuits and Systems 8
(10): 1065-1073 (1989)
Coauthor
Index
1
B. J. Sheu
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Sun May 17 03:24:02 2009 by
Michael Ley
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ley@uni-trier.de
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