2003 | ||
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4 | EE | K. S. How Tai Wah: An analysis of the coupling effect I: single test data. Sci. Comput. Program. 48(2-3): 119-161 (2003) |
2000 | ||
3 | K. S. How Tai Wah: A Theoretical Study of Fault Coupling. Softw. Test., Verif. Reliab. 10(1): 3-45 (2000) | |
1996 | ||
2 | K. S. How Tai Wah: Black-Box Testing: Techniques for Functional Testing of Software and Systems, by Boris Beizer, Wiley, 1995 (Book Review). Softw. Test., Verif. Reliab. 6(1): 49-50 (1996) | |
1995 | ||
1 | K. S. How Tai Wah: Fault Coupling in Finite Bijective Functions. Softw. Test., Verif. Reliab. 5(1): 3-47 (1995) |