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Russell J. Wagner

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1997
2EEJoel A. Jorgenson, Russell J. Wagner: Design-For-Test in a Multiple Substrate Multichip Module. J. Electronic Testing 10(1-2): 97-107 (1997)
1993
1 Russell J. Wagner, Joel A. Jorgenson: Design-For-Test Techniques Utilized in an Avionics Computer MCM. ITC 1993: 373-382

Coauthor Index

1Joel A. Jorgenson [1] [2]

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