| 2008 |
|---|
| 4 | EE | Diana Vega,
George Din,
Stefan Taranu,
Ina Schieferdecker:
Application of Clustering Methods for Analysing of TTCN-3 Test Data Quality.
ICSEA 2008: 237-244 |
| 3 | EE | George Din,
Diana Vega,
Ina Schieferdecker:
Automated Maintainability of TTCN-3 Test Suites Based on Guideline Checking.
SEUS 2008: 417-430 |
| 2007 |
|---|
| 2 | | Benjamin Zeiss,
Diana Vega,
Ina Schieferdecker,
Helmut Neukirchen,
Jens Grabowski:
Applying the ISO 9126 quality model to test specifications - exemplified for TTCN-3 test specifications.
Software Engineering 2007: 231-244 |
| 1 | EE | Diana Vega,
Ina Schieferdecker,
George Din:
Test Data Variance as a Test Quality Measure: Exemplified for TTCN-3.
TestCom/FATES 2007: 351-364 |
