| |
| 1996 | ||
|---|---|---|
| 1 | John G. Hagedorn, Holly E. Rushmeier, John Blendell, Mark Vaudin: A System for Measuring Surface Facet Orientation from Atomic Force Microscope Data. IEEE Visualization 1996: 397-400 | |
| 1 | John Blendell | [1] |
| 2 | John G. Hagedorn | [1] |
| 3 | Holly E. Rushmeier | [1] |