| |
| 1996 | ||
|---|---|---|
| 1 | EE | Kuen-Jong Lee, Jing-Jou Tang, Tsung-Chu Huang, Cheng-Liang Tsai: Combination Of Automatic Test Pattern Generation And Built-In Intermediate Voltage Sensing For Detecting CMOS Bridging Faults. Asian Test Symposium 1996: 100- |
| 1 | Tsung-Chu Huang | [1] |
| 2 | Kuen-Jong Lee | [1] |
| 3 | Jing-Jou Tang | [1] |