| |
| 2008 | ||
|---|---|---|
| 2 | EE | Pan Tiejun, Zheng Leina, Fang Chengbin: Defect Tracing System Based on Orthogonal Defect Classification. CSSE (2) 2008: 574-577 |
| 2007 | ||
| 1 | Wang Qin, Pan Tiejun, Xi Lifeng, Yang Xiujin, Zheng Leina: Software Defect Analysis Model Based on Orthogonal Defect Classification. IMECS 2007: 1082-1086 | |
| 1 | Fang Chengbin | [2] |
| 2 | Zheng Leina | [1] [2] |
| 3 | Xi Lifeng | [1] |
| 4 | Wang Qin | [1] |
| 5 | Yang Xiujin | [1] |