Kuen-Shiuan Tian
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2009
1
EE
Jone F. Chen
, Kuen-Shiuan Tian,
Shiang-Yu Chen
,
Kuo-Ming Wu
,
C. M. Liu
: Effect of NDD dosage on hot-carrier reliability in DMOS transistors.
ISQED 2009
: 226-229
Coauthor
Index
1
Jone F. Chen
[
1
]
2
Shiang-Yu Chen
[
1
]
3
C. M. Liu
[
1
]
4
Kuo-Ming Wu
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
