Mukesh Taneja
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1994
1
Mukesh Taneja,
Nukala Viswanadham
: Inspection Allocation in Manufacturing Systems: A Genetic Algorithm Approach.
ICRA 1994
: 3537-3542
Coauthor
Index
1
Nukala Viswanadham
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
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