Akira Taneda
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1976
1
EE
Akira Taneda,
Hikaru Oku
,
Daiji Namba
: An on-line test program for peripheral devices.
AFIPS National Computer Conference 1976
: 1001-1006
Coauthor
Index
1
Daiji Namba
[
1
]
2
Hikaru Oku
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
