| |
| 2005 | ||
|---|---|---|
| 1 | EE | Takeshi Sumi, Osamu Mizuno, Tohru Kikuno, Masayuki Hirayama: An Effective Testing Method for Hardware Related Fault in Embedded Software. IEICE Transactions 88-D(6): 1142-1149 (2005) |
| 1 | Masayuki Hirayama | [1] |
| 2 | Tohru Kikuno | [1] |
| 3 | Osamu Mizuno | [1] |