Toshio Sudo
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2005
1
EE
Toshio Sudo: Radiated Harmonics Characterization of CMOS Test Chip with On-Chip Decoupling Capacitance.
IEICE Transactions 88-B
(8): 3195-3199 (2005)
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Sun May 17 03:24:02 2009 by
Michael Ley
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ley@uni-trier.de
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