| |
| 1983 | ||
|---|---|---|
| 3 | C. Timoc, M. Buehler, T. Griswold, C. Pina, F. Stott, L. Hess: Logical Models of Physical Failures. ITC 1983: 546-553 | |
| 2 | C. Timoc, F. Stott, K. Wickman, L. Hess: Adaptive Self-Test for a Microprocessor. ITC 1983: 701-705 | |
| 1982 | ||
| 1 | C. Timoc, F. Stott, L. Hess: A Novel Approach to Test Generation for VLSI. COMPCON 1982: 78-86 | |
| 1 | M. Buehler | [3] |
| 2 | T. Griswold | [3] |
| 3 | L. Hess | [1] [2] [3] |
| 4 | C. Pina | [3] |
| 5 | C. Timoc | [1] [2] [3] |
| 6 | K. Wickman | [2] |