Geoff Staneff
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2008
1
EE
Dan Travison
, Geoff Staneff: Test Instrumentation and Pattern Matching for Automatic Failure Identification.
ICST 2008
: 377-386
Coauthor
Index
1
Dan Travison
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
